Monitoring the process mean based on attribute inspection when a small sample is available-Reference-Cited by-同舟云学术

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Monitoring the process mean based on attribute inspection when a small sample is available

Published:2015-11 Issue:11 Volume:66 Page:1860-1867
ISSN:0160-5682
Container-title:Journal of the Operational Research Society
language:en
Short-container-title:Journal of the Operational Research Society

Author:

da Costa Quinino Roberto¹,Lee Ho Linda²,Galindo Trindade Anderson Laécio¹

Affiliation:

1. Universidade Federal de Minas Gerais Belo Horizonte Brazil

2. Universidade de São Paulo São Paulo Brazil

Publisher

Informa UK Limited

Subject

Marketing,Management Science and Operations Research,Strategy and Management,Management Information Systems

Link

http://link.springer.com/content/pdf/10.1057/jors.2014.102.pdf

Reference16 articles.

1. A broader view of the economic design of the X-bar chart in the semiconductor industry

2. Economic statistical design for x-bar control charts under non-normal distributed data with Weibull in-control time

3. Economic design of variable parametersX̄control charts for processes with fuzzy mean shifts

4. Economic-statistical design of the chart used to control a wandering process mean using genetic algorithm

5. Multiobjective Genetic Algorithm Approach to the Economic Statistical Design of Control Charts with an Application to X¯bar andS2Charts

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Max-X¯Stn control chart for monitoring mean and variability process;AIP Conference Proceedings;2023

2. A new np_CEV chart for monitoring process mean shifts based on an attribute inspection;Communications in Statistics - Theory and Methods;2022-06-20

3. The use of npx$np_{x}$‐type attribute charts to monitor the variance;Quality and Reliability Engineering International;2021-11-12

4. Improving the performance of the attribute charts: X¯tn$\bar{X}_{tn}$ and Stn2$S^2_{tn}$;Quality and Reliability Engineering International;2021-11-09

5. A trinomial chart for monitoring the process variance;Computers & Industrial Engineering;2021-07

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