Indirect Growth Curves Remain the Best Choice for Lichenometry: Evidence from Directly Measured Growth Rates from Svalbard
Author:
Affiliation:
1. Department of Geology and Geography, Mount Holyoke College, South Hadley, Massachusetts 01075, U.S.A. mailto:
Publisher
Informa UK Limited
Subject
Earth-Surface Processes,Ecology, Evolution, Behavior and Systematics,Global and Planetary Change
Link
https://www.tandfonline.com/doi/pdf/10.1657/1938-4246-43.4.621
Reference48 articles.
1. Dating Slope Deposits and Estimating Rates of Rock Wall Retreat in Northwest Spitsbergen by Lichenometry
2. Growth of crustose lichens: a review
3. GROWTH CURVE OF THE LICHEN RHIZOCARPON GEOGRAPHICUM
4. Radial Growth of Rhizocarpon Section Rhizocarpon Lichen Thalli over Six Years at Snoqualmie Pass in the Cascade Range, Washington State
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A simple test of lichenometric dating using bidecadal growth of Rhizocarpon geographicum agg. and structure-from-motion photogrammetry;Geomorphology;2021-07
2. Estimating the age and mechanism of boulder transport related with extreme waves using lichenometry;Progress in Physical Geography: Earth and Environment;2020-06-17
3. Timing of Little Ice Age maxima and subsequent glacier retreat in northern Troms and western Finnmark, northern Norway;Arctic, Antarctic, and Alpine Research;2020-01-01
4. Debris flow recurrence periods and multi-temporal observations of colluvial fan evolution in central Spitsbergen (Svalbard);Geomorphology;2017-11
5. Colonization of mid- and late-Holocene moraines by lichens and trees in the Magellanic sub-Antarctic province;Polar Biology;2017-03-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3