Rank-Metric Codes, Semifields, and the Average Critical Problem-Reference-Cited by-同舟云学术

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Rank-Metric Codes, Semifields, and the Average Critical Problem

Published:2023-06-15 Issue:2 Volume:37 Page:1079-1117
ISSN:0895-4801
Container-title:SIAM Journal on Discrete Mathematics
language:en
Short-container-title:SIAM J. Discrete Math.

Author:

Gruica Anina¹,Ravagnani Alberto¹,Sheekey John²,Zullo Ferdinando³^ORCID

Affiliation:

1. Department of Mathematics and Computer Science, Eindhoven University of Technology, 5600 MB Eindhoven, The Netherlands.

2. School of Mathematics and Statistics, University College Dublin, Belfield, Dublin 4, Ireland.

3. Dipartimento di Matematica e Fisica, Università degli Studi della Campania “Luigi Vanvitelli,” I–81100 Caserta, Italy.

Funder

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Istituto Nazionale di Alta Matematica

Technische Universiteit Eindhoven

Università degli Studi della Campania Luigi Vanvitelli

Publisher

Society for Industrial & Applied Mathematics (SIAM)

Subject

General Mathematics

Reference47 articles.

1. Generalized twisted fields

2. Maximal Ferrers Diagram Codes: Constructions and Genericity Considerations

3. Arcs in finite projective spaces

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