Circuits Resilient to Short-Circuit Errors-Reference-Cited by-同舟云学术

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Circuits Resilient to Short-Circuit Errors

Published:2024-07-16 Issue: Volume: Page:STOC22-224-STOC22-259
ISSN:0097-5397
Container-title:SIAM Journal on Computing
language:en
Short-container-title:SIAM J. Comput.

Author:

Efremenko Klim¹^ORCID,Haeupler Bernhard²,Kalai Yael Tauman³,Kamath Pritish⁴,Kol Gillat⁵,Resch Nicolas⁶^ORCID,Saxena Raghuvansh R.⁷

Affiliation:

1. Computer Science Department, Ben Gurion University, Ben Gurion Road 1, mailbox 653 Beer Sheva, 8410501, Israel.

2. INSAIT Institute, Synergy Tower, Sofia Tech Park, blvd. Tsarigradsko shose 111R, 1784 Sofia, Bulgaria, and Computer Science Department, ETH Zurich, OAT, Andreasstrasse 5, 8092 Zürich, Switzerland.

3. Microsoft Research & MIT, 32 Vassar st #G682, Cambridge, MA 02421 USA.

4. Google Research, Google Gradient Canopy, 2000 N Shoreline Blvd, Mountain View, CA 94043 USA.

5. Department of Computer Science at Princeton University, 35 Olden st, Princeton, NJ 08544 USA.

6. Informatics Institute, University of Amsterdam, Science Park 900, Amsterdam, North-Holland, NL 1098 XX, The Netherlands.

7. School of Technology and Computer Science, Tata Institute of Fundamental Research, 1, Dr. Homi Bhabha Road, Mumbai, 400005 India.

Publisher

Society for Industrial & Applied Mathematics (SIAM)

Reference28 articles.

1. Size-depth tradeoffs for Boolean formulae

2. Lower bounds for cutting planes proofs with small coefficients

3. On the maximum tolerable noise for reliable computation by formulas

4. Signal propagation and noisy circuits

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