Integrated X-Ray Diffraction Intensities from Single Crystals

Abstract

AbstractThe advantages and accuracy of counter equipment for the measurement of the intensity of scattered X-rays from small single crystals are discussed and illustrated. Several precautions necessary to obtain reliable intensity measurements are discussed. The equi-inclination method of inspecting all accessible reflections is treated in detail. The practicality of the stationary crystal method for determining integrated intensities, in principle the most accurate and rapid method, is demonstrated. Suggestions for improving the accuracy and speed of collecting data are made.