Abstract
The definitions for important Rietveld error indices are defined and discussed. It is shown that while smaller error index values indicate a better fit of a model to the data, wrong models with poor quality data may exhibit smaller values error index values than some superb models with very high quality data.
Publisher
Cambridge University Press (CUP)
Subject
Condensed Matter Physics,Instrumentation,General Materials Science,Radiation
Reference9 articles.
1. Schwartzenbach D. , Abrahams S. C. , Flack H. D. , Prince E. , and Wilson A. J. C. (1996). “Statistical descriptors in crystallography, Uncertainty of measurement,” .
2. Mathematical Techniques in Crystallography and Materials Science
3. Rietveld refinement guidelines
4. Ab-initio structure determination of LiSbWO6 by X-ray powder diffraction
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