Lactones in 193 nm resists: What do they do?
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SPIE
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Physical model-based ArF photoresist formulation development;AIP Advances;2024-02-01
2. Mesoscale modeling: a study of particle generation and line-edge roughness;Journal of Micro/Nanolithography, MEMS, and MOEMS;2014-03-12
3. Methacrylate-based polymer films useful in lithographic applications exhibit different glass transition temperature-confinement effects at high and low molecular weight;Polymer;2014-03
4. Understanding dissolution behavior of 193nm photoresists in organic solvent developers;SPIE Proceedings;2012-03-29
5. Particle generation during photoresist dissolution;SPIE Proceedings;2010-03-11
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