RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development-Reference-Cited by-同舟云学术

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RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development

Published:2015-06-04 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Cathignol A.,Vauquelin G.,Brunner A.,Destefanis V.,Rubaldo L.,Maillard M.,Runtz M.

Publisher

SPIE

Reference10 articles.

1. Temperature dependence of 1/f noise, defects and dark current in small pitch MWIR and LWIR HDVIP reg HgCdTe FPAs;Strong,2013

2. Quantification and Modeling of RMS Noise Distributions in HDVIP® Infrared Focal Plane Arrays

3. X. Brenière, L. Rubaldo, F. Dupont, “Sofradir’s recent improvements regarding the reliability and performance of HgCdTe IR detectors” Proc. SPIE 9070, Infrared Technology and Applications XL, 90702W

4. Infrared focal plane array storage life assessment by accelerated aging;Asatourian,1998

5. Status of MCT focal plane arrays in France

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1. The Tobin Coefficient: A Relevant Photodetector Performance Metric for IR Imaging;Journal of Electronic Materials;2024-07-26

2. Low frequency noise in p-InAsSbP/n-InAs infrared photodiodes;Semiconductor Science and Technology;2018-05-21

3. Application of cooled IR focal plane arrays in thermographic cameras;SPIE Proceedings;2016-05-03

4. Mid-Wave HgCdTe FPA Based on P on N Technology: HOT Recent Developments. NETD: Dark Current and 1/f Noise Considerations;Journal of Electronic Materials;2016-04-14

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