New reconstruction method for x-ray testing of multilayer printed circuit board

Author:

Wang Gao

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference16 articles.

1. Three-dimensional x-ray laminography as a tool for detection and characterization of BGA package defects

2. H. K. Kim, S. C. Jeon, et al. , “X-ray laminographic application of lens-coupled CMOS detector for PCB inspection,” inNuclear Science Symposium Conference Record, IEEE, vol. 3, pp. 1620–1623 (2001).

3. Micro-CT for nondestructive 3D reconstruction of MEMS and sensors

4. Error analysis on a generalized Feldkamp's cone-beam computed tomography algorithm

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