Author:
Figueiro Thiago,Browning Clyde,Thornton Martin J.,Vannufel Cyril,Schiavone Patrick
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Analytical Placement Considering the Electron-Beam Fogging Effect;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-03
2. Fogging Effect Aware Placement in Electron Beam Lithography;Proceedings of the 54th Annual Design Automation Conference 2017;2017-06-18