Nanofocused x-ray beams applied for mapping strain in core-shell nanowires-Reference-Cited by-同舟云学术

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Nanofocused x-ray beams applied for mapping strain in core-shell nanowires

Published:2015-09-18 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Stankevič Tomaš,Dzhigaev Dmitry,Bi Zhaoxia,Rose Max,Shabalin Anatoly,Reinhardt Juliane,Mikkelsen Anders,Samuelson Lars,Falkenberg Gerald,Vartanyants Ivan A.,Feidenhans'l Robert

Publisher

SPIE

Reference23 articles.

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire;Journal of Applied Crystallography;2021-02-01

2. Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments;Journal of Synchrotron Radiation;2020-08-12

3. Unraveling the Spatial Distribution of Catalytic Non-Cubic Au Phases in a Bipyramidal Microcrystallite by X-ray Diffraction Microscopy;ACS Nano;2020-06-03

4. Bragg coherent diffractive imaging of strain at the nanoscale;Journal of Applied Physics;2019-03-28

5. Structural Changes in a Single GaN Nanowire under Applied Voltage Bias;Nano Letters;2018-07-23

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