PCB defect detection based on PP-YOLOv2-Reference-Cited by-同舟云学术

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PCB defect detection based on PP-YOLOv2

Published:2022-06-15 Issue: Volume: Page:
ISSN:
Container-title:International Conference on Advanced Algorithms and Neural Networks (AANN 2022)
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Author:

WANG JIAN,Zhang Yu Mei

Publisher

SPIE

Reference11 articles.

1. IEEE Access

2. Automated optical inspection system for surface mount device light emitting diodes;Kuo;Journal of Intelligent Manufacturing,2016

3. Hinton G E, Salakhutdinov R R.Reducing the dimensionality of data with neural networks[J].science,2006, 313 (5786): 504–507.

4. Deep learning

5. Computer and robot vision[M];Haralick,1992

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. YOLO V7: Advancing Printed Circuit Board Defect Detection and the Quality Assurance;2023 Global Conference on Information Technologies and Communications (GCITC);2023-12-01

2. PCB surface defect fast detection method based on attention and multi-source fusion;Multimedia Tools and Applications;2023-06-03

3. Fault Detection and Quality Inspection of Printed Circuit Board Using Yolo-v7 Algorithm of Deep Learning;2023 7th International Multi-Topic ICT Conference (IMTIC);2023-05-10

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