1. L. B. Wolff, "Polarization-based material classification from specular reflection," IEEE Trans. Pattern Anal. Mach. Intell. 12, 11 (1990) 10.1109/34.61705
2. W. R. Hunter, "Errors in using the reflectance vs angle of incidence method for measuring optical constants," J. Opt. Soc. Am. 55, 10 (1965) 10.1364/JOSA.55.001197
3. S. P. F. Humphreys-Owen, "Comparison of reflection methods for measuring optical constants without polarimetric analysis, and proposal for new methods based on the Brewster angle," Proc. Phys. Soc. 77, 949-957 (1961) 10.1088/0370-1328/77/5/301
4. F. Sagnard, F. Bentabet, and C. Vignat, "In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)," IEEE Trans. Instr. Meas. 54, 1266-1273 (2005) 10.1109/TIM.2005.847203
5. H. Kramer, Observation of the Earth and its environment, Springer, Berlin (2002).