<title>Generalized ellipsometry of complex mediums in layered systems

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Generalized ellipsometry of complex mediums in layered systems

Published:2002-06-25 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Schubert Mathias,Kasic Alexander,Hofmann Tino,Gottschalch Volker,Off Juergen,Scholz Ferdinand,Schubert Eva,Neumann Horst,Hodgkinson Ian J.,Arnold Matthew D.,Dollase Wayne A.,Herzinger Craig M.

Publisher

SPIE

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument;Review of Scientific Instruments;2014-07

3. Polymer Blends and Composites;Ellipsometry of Functional Organic Surfaces and Films;2014

4. Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability;Review of Scientific Instruments;2013-02

5. Studies of optical anisotropy in opals by normal incidence ellipsometry;Thin Solid Films;2011-02

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