Photoreflectance Characterization Of GaAs/A1GaAs Thin Films, Heterojunctions And Multiple Quantum Well Structures-Reference-Cited by-同舟云学术

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Photoreflectance Characterization Of GaAs/A1GaAs Thin Films, Heterojunctions And Multiple Quantum Well Structures

Published:1985-06-28 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
language:
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Author:

Glembocki O. J.¹,Shanabrook B. V.¹,Bottka N.¹,Beard W. T.¹,Comas J.¹

Affiliation:

1. Naval Research Laboratory (United States)

Publisher

SPIE

Cited by 50 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Franz–Keldysh oscillations in modulation spectroscopy;Journal of Applied Physics;1995-08-15

2. Surface and bulk modulation in photoreflectance from undoped GaAs;Physical Review B;1994-03-15

3. Study of GaInP/GaAs/GaInP Double Heterostructures Grown by MOCVD with Photoreflectance and Photoluminescence;MRS Proceedings;1994

4. Electroreflectance‐photoreflectance technique for studies of built‐in electric field in layered materials;Applied Physics Letters;1993-07-26

5. Two modulation mechanisms for photoreflectance from GaAs/AlAs multiple quantum well;Superlattices and Microstructures;1993-04

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