Reliability and failure mechanisms of oxide VCSELs in non-hermetic enviroments

Author:

Xie Suning,Herrick Robert W.,De Brabander Gregory N.,Widjaja Wilson H.,Koelle Uli,Cheng An-Nien,Giovane Laura M.,Hu Frank Z.,Keever Mark R.,Osentowski Tim,McHugo Scott A.,Mayonte Myrna S.,Kim Seongsin M.,Chamberlin Danielle R.,Rosner S. Jeffrey,Girolami Grant

Publisher

SPIE

Cited by 20 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Degradation mechanism of 1310nm vertical cavity surface emission laser;AOPC 2023: AI in Optics and Photonics;2023-12-21

2. Study on Dark-line Defect Formation in High-Power Oxide-Confined VCSEL Arrays;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

3. 垂直腔面发射激光器中位错形成及扩展特性分析;Laser & Optoelectronics Progress;2023

4. Degradation Characteristics and Reliability Assessment of 1310 nm VCSEL for Microwave Photonic Link;Applied Sciences;2022-05-30

5. Analysis of common failure causes in oxide VCSELs;International Conference on Optoelectronic Materials and Devices (ICOMD 2021);2022-02-16

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