Modelling of coherence scanning interferometry for complex surfaces based on a boundary element method
Author:
Publisher
SPIE
Reference38 articles.
1. The Meaning and Measure of Vertical Resolution in Optical Surface Topography Measurement
2. Optical Measurement of Surface Topography
3. Three-dimensional sensing of rough surfaces by coherence radar
4. Efficient nonlinear algorithm for envelope detection in white light interferometry
5. Surface Profiling by Analysis of White-light Interferograms in the Spatial Frequency Domain
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