1. Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications
2. M. Luria, E. Adin, M. Moran, D. Yaffe, M. Haemek, and J. Kawski , “Automatic defect classification using fuzzy logic,” inProc. Advanced Semiconductor Manufacturing Conference and Workshop (ASMC 93), pp. 191–193, IEEE/SEMI (1993).
3. S. Rao, S. Saxena, P. Apte, P. K. Mozumder, J. Davis, R. Burch, and K. Vasanth , “Yield prediction under non-standard data distributions,” inTechnical Proc. 1998 Int. Conf. Modeling and Simulation of Microsystems, pp. 122–126, NSTI (1998).
4. S. I. Association , “International technology Roadmap for Semiconductors,” http//public.itrs.net/Files/2001ITRS/Home.htm (2001).