Comparative STEREO-LID (Spatio-TEmporally REsolved Optical Laser-Induced Damage) studies of critical defect distributions in IBS, ALD, and electron-beam coated dielectric films-Reference-Cited by-同舟云学术

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Comparative STEREO-LID (Spatio-TEmporally REsolved Optical Laser-Induced Damage) studies of critical defect distributions in IBS, ALD, and electron-beam coated dielectric films

Published:2015-11-23 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Laser-Induced Damage in Optical Materials: 2015
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Author:

Xu Yejia,Khabbazi Amir,Day Travis,Brown Andrew,Emmert Luke A.,Talghader Joseph J.,Field Ella,Kletecka Damon,Bellum John,Patel Dinesh,Menoni Carmen S.,Rudolph Wolfgang

Publisher

SPIE

Reference23 articles.

1. Point defects in Sc2O3 thin films by ion beam sputtering

2. Substrate effects on absorption of coated surfaces

3. Laser-induced damage at 1064 nm, 125 psec

4. Laser-induced damage of materials in bulk, thin-film, and liquid forms

5. High fluence laser damage precursors and their mitigation in fused silica

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of 1-on-1 damage in high reflectors using the spatially-temporally resolved optical laser-induced damage (STEREO-LID) technique;Laser-Induced Damage in Optical Materials 2017;2017-11-13

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