X-ray investigations of a near surface layer of metal samples-Reference-Cited by-同舟云学术

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X-ray investigations of a near surface layer of metal samples

Published:2000-11-02 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Gilev Oleg N.,Asadchikov Victor E.,Duparre Angela,Havronin Nikolai A.,Kozhevnikov Igor V.,Krivonosov Yury S.,Kuznetsov Sergey P.,Mikerov Vitaly I.,Ostashev Vladimir I.,Tukarev Vladimir A.

Publisher

SPIE

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Reflectometry of DMPS Monolayers on a Water Substrate;Journal of Experimental and Theoretical Physics;2017-12

2. A RKK-1-100 X-ray calibration facility;Instruments and Experimental Techniques;2008-01

3. X-ray investigations of surface roughnesses;Crystallography Reports;2003-09

4. X-ray study of surfaces and interfaces;SPIE Proceedings;2001-12-10

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