X‐ray refractive index: A tool to determine the average composition in multilayer structures
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.96749
Reference5 articles.
1. Photoluminescence of an AlAs/GaAs Superlattice Grown by MBE in the 0.7–0.8 µm Wavelength Region
2. Bragg‐reflection profiles of graphite and alkali–graphite intercalation compounds: Comparison of double‐axis and triple‐axis spectrometer results
3. X‐ray evidence for a terraced GaAs/AlAs superlattice
4. Measurements of anomalous dispersion made with X-ray interferometers
5. Determination of anomalous scattering factors in GaAs using x-ray refraction through a prism
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