Dependencies of secondary electron yields on work function for metals by electron and ion bombardment
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.126682
Reference13 articles.
1. Contrast mechanisms in scanning ion microscope imaging for metals
2. Theory of Secondary Electron Emission. I. General Theory for Nearly-Free-Electron Metals
3. Electron emission from clean metal surfaces induced by low-energy light ions
4. The work function of the elements and its periodicity
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