Nanoscopic spectroscopy of potential barriers formed around V-pits in InGaN/GaN multiple quantum wells on moderate temperature GaN pit expansion layers
Author:
Affiliation:
1. Department of Electrical and Electronic Engineering, Yamaguchi University, 2-16-1 Tokiwadai, Ube, Yamaguchi 755-8611, Japan
2. Ube Industries, Ltd., 1978-96 Ogushi Ube, Yamaguchi 755-8633, Japan
Funder
Japan Society for the Promotion of Science
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5043578
Reference27 articles.
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5. Recombination dynamics of localized excitons inIn0.20Ga0.80N-In0.05Ga0.95N multiple quantum wells
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1. Study on higher-energy emission observed locally around V-pits on InGaN/GaN quantum wells grown on moderate-temperature GaN;Journal of Applied Physics;2021-08-07
2. Luminescence redshift of thick InGaN/GaN heterostructures induced by the migration of surface adsorbed atoms;Journal of Crystal Growth;2021-07
3. Variations of light emission and carrier dynamics around V-defects in InGaN quantum wells;Journal of Applied Physics;2020-12-14
4. Effect of horizontal p–n junction on optoelectronics characteristics in InGaN-based light-emitting diodes with V-shaped pits;Journal of Physics D: Applied Physics;2020-06-09
5. Detailed surface analysis of V-defects in GaN films on patterned silicon(111) substrates by metal–organic chemical vapour deposition;Journal of Applied Crystallography;2019-05-31
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