Atom‐Probe Field Ion Microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://physicstoday.scitation.org/doi/pdf/10.1063/1.881389
Reference29 articles.
1. Das Feldionenmikroskop
2. The Atom‐Probe Field Ion Microscope
3. Application of a position‐sensitive detector to atom probe microanalysis
4. Methods for a precision measurement of ionic masses and appearance energies using the pulsed‐laser time‐of‐flight atom probe
5. Surface Diffusion
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