Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization-Reference-Cited by-同舟云学术

Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

Published:2011-03 Issue:3 Volume:82 Page:033101
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Hirata K.,Saitoh Y.,Chiba A.,Yamada K.,Takahashi Y.,Narumi K.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3541799

Reference14 articles.

1. Design and performance of a reflectron based time‐of‐flight secondary ion mass spectrometer with electrodynamic primary ion mass separation

2. Time-of-flight secondary ion mass spectrometry: techniques and applications for the characterization of biomaterial surfaces

3. Mass Spectrometry Reviews

4. Nonlinear effects in ion emission from LiF induced by N+ and N2+ MeV ion impact

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