Simple method for accurate ray tracing in electrostatic lenses

Author:

Kisker Erhard1

Affiliation:

1. Institut für Festkörperforschung der Kernforschungsanlage Jülich, D‐5170 Jülich, West Germany

Publisher

AIP Publishing

Subject

Instrumentation

Reference8 articles.

1. S. Bertram, J. Appl. Phys. 13, 496 (1942).JAPIAU0021-8979

2. J. Fink and E. Kisker, Rev. Sci. Instrum. 51, 918 (1980).RSINAK0034-6748

3. P. Grivet, Electron Optics (Pergamon, Oxford, 1965).

4. The program as described here is a conversion of the program originally written in Algol 60 [E. Kisker, thesis, Hamburg, 1972 (unpublished)] to “Microsoft” BASIC, as used in the “PET” and other “personal” computers. Special attention has been given to optimize speed, resulting in the compact listing. The following versions of the program are presently available: The FORTRAN version (Ref. 2) which includes a lens‐voltage optimization procedure, the Algol 60 version (on request from the author), and the Basic program as described here. A compilation into MC 6502 machine language which increases the speed by a factor of 510 is in preparation.

5. E. Kisker, Z. Phys. 256, 121 (1972).ZEPYAA0044-3328

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1. Notes and References;Principles of Electron Optics;2018

2. Charged particle dynamics in a ‘high-pressure’ laser ion source;Journal of Physics D: Applied Physics;2011-03-10

3. Multi-element cylindrical electrostatic lens systems for focusing and controlling charged particles;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2005-12

4. Notes and References for Volume 2;Principles of Electron Optics;1996

5. Atomic negative-ion resonances;Reviews of Modern Physics;1994-04-01

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