Complex impedance of TESs under AC bias using FDM readout system
Author:
Affiliation:
1. SRON Netherlands Institute for Space Research, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands
2. Faculty of Applied Science, Delft University of Technology, Delft, The Netherlands
Funder
European Space Agency
H2020 Excellent Science
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5089739
Reference38 articles.
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4. Review of Dark Matter Direct Detection Using Cryogenic Detectors
5. High intrinsic energy resolution photon number resolving detectors
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