Electroabsorption field imaging between coplanar metal contacts on semi‐insulating semiconductor epilayers-Reference-Cited by-同舟云学术

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Electroabsorption field imaging between coplanar metal contacts on semi‐insulating semiconductor epilayers

Published:1996-01 Issue:1 Volume:68 Page:72-74
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Nolte D. D.,Chen N. P.,Melloch M. R.,Montemagno C.,Haegel N. M.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.116761

Reference14 articles.

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of organic semiconductor-metal interfaces on the photoresponse of functionalized anthradithiophene thin films;Journal of Applied Physics;2009-05-15

2. Localized Electric Field Mapping in Planar Semiconductor Structures;IEEE Transactions on Electron Devices;2008-06

3. Measurements of absorption coefficient and refractive index changes without the Kramers–Kronig relation in photorefractive quantum wells of GaAs;Journal of Optics A: Pure and Applied Optics;2003-10-27

4. Photorefractive semiconductor nanostructures;Nanostructured Materials and Nanotechnology;2002

5. Simultaneous Measurement of Absorption and Phase Gratings in GaAs Photorefractive Quantum Wells;Photorefractive Effects, Materials, and Devices;2001

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