Expanding a polarized synchrotron beam for full-field x-ray fluorescence imaging-Reference-Cited by-同舟云学术

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Expanding a polarized synchrotron beam for full-field x-ray fluorescence imaging

Published:2019-11-01 Issue:11 Volume:90 Page:113704
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Zhao Wenyang¹²^ORCID,Hirano Keiichi³,Sakurai Kenji¹²^ORCID

Affiliation:

1. University of Tsukuba, 1-1-1, Tennodai, Tsukuba, Ibaraki 305-0006, Japan

2. National Institute for Materials Science, 1-2-1, Sengen, Tsukuba, Ibaraki 305-0047, Japan

3. Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1, Oho, Tsukuba, Ibaraki 305-0801, Japan

Funder

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5115421

Reference37 articles.

1. An X‐ray Camera

2. Total-reflection X-ray fluorescence imaging

3. Full-field x-ray fluorescence imaging microscope with a Wolter mirror

4. Compact pnCCD-Based X-ray Camera with High Spatial and Energy Resolution: A Color X-ray Camera

5. Macro and Micro Full Field X-Ray Fluorescence with an X-Ray Pinhole Camera Presenting High Energy and High Spatial Resolution

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation;Metrologia;2023-04-21

2. Enabling Coarse X-ray Fluorescence Imaging Scans with Enlarged Synchrotron Beam by Means of Mosaic Crystal Defocusing Optics;International Journal of Molecular Sciences;2022-04-23

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