In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X-Reference-Cited by-同舟云学术

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In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Published:2018-10 Issue:10 Volume:89 Page:10F107
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kring J.¹,Pablant N.²^ORCID,Langenberg A.³^ORCID,Rice J.⁴,Delgado-Aparicio L.²,Maurer D.¹^ORCID,Traverso P.¹,Bitter M.²,Hill K.²,Reinke M.²^ORCID

Affiliation:

1. Auburn University, Auburn, Alabama 36849-5412, USA

2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA

3. Max-Planck-Institut für Plasmaphysik, Greifswald, Germany

4. Plasma Science Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5038809

Reference8 articles.

1. Layout and results from the initial operation of the high-resolution x-ray imaging crystal spectrometer on the Large Helical Device

2. Spatially resolved high resolution x-ray spectroscopy for magnetically confined fusion plasmas (invited)

3. Measurement of helium-like and hydrogen-like argon spectra using double-crystal X-ray spectrometers on EAST

4. Multi-energy x-ray detector calibration for Te and impurity density (nZ) measurements of MCF plasmas

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