Determining interface structures in vertically aligned nanocomposite films-Reference-Cited by-同舟云学术

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Determining interface structures in vertically aligned nanocomposite films

Published:2019-06 Issue:6 Volume:7 Page:061105
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Zhu Bonan¹^ORCID,Schusteritsch Georg¹²^ORCID,Lu Ping³,MacManus-Driscoll Judith L.¹^ORCID,Pickard Chris J.¹²^ORCID

Affiliation:

1. Department of Materials Science and Metallurgy, University of Cambridge, Cambridge, United Kingdom

2. Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577, Japan

3. Sandia National Laboratories, Albuquerque, New Mexico 87185, USA

Funder

Royal Society

China Scholarship Council

Cambridge Commonwealth, European and International Trust

Engineering and Physical Sciences Research Council

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5099204

Reference61 articles.

1. Self-Assembled Heteroepitaxial Oxide Nanocomposite Thin Film Structures: Designing Interface-Induced Functionality in Electronic Materials

2. Composite epitaxial thin films: A new platform for tuning, probing, and exploiting mesoscale oxides

3. New epitaxy paradigm in epitaxial self-assembled oxide vertically aligned nanocomposite thin films

4. Strain control and spontaneous phase ordering in vertical nanocomposite heteroepitaxial thin films

5. Role of scaffold network in controlling strain and functionalities of nanocomposite films

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