Effect of the induced electron traps by oxygen plasma treatment on transfer characteristics of organic thin film transistors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3636411
Reference20 articles.
1. Time and temperature dependence of instability mechanisms in amorphous silicon thin‐film transistors
2. Correcting effective mobility measurements for the presence of significant gate leakage current
3. An analysis of the difference in behavior of top and bottom contact organic thin film transistors using device simulation
4. Influence of postannealing on polycrystalline pentacene thin film transistor
5. Photoinduced doping effect of pentacene field effect transistor in oxygen atmosphere studied by displacement current measurement
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