Local force gradients on Si(111) during simultaneous scanning tunneling/atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2717115
Reference18 articles.
1. Imaging of all Dangling Bonds and their Potential on theGe/Si(105)Surface by Noncontact Atomic Force Microscopy
2. Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy
3. Simultaneous current-, force-, and work-function measurement with atomic resolution
4. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
5. High-sensitivity noncontact atomic force microscope/scanning tunneling microscope (nc AFM/STM) operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
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