Environmental chamber for an atomic force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Reference8 articles.
1. E. Meyer, H. F. Hug, and R. Bennewitz ,Scanning Probe Microscopy(Springer, Berlin, 2004).
2. Controlled-atmosphere chamber for atomic force microscopy investigations
3. Atomic force microscope chamber forin situstudies of ice
4. Scanning force microscope and vacuum chamber for the study of ice films: Design and first results
5. Atomic force microscope with improved scan accuracy, scan speed, and optical vision
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