Method for Determining Composition Profiles and Diffusion‐Generated Substructure in Small Diffusion Zones
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1659771
Reference9 articles.
1. X‐Ray Diffraction from a Binary Diffusion Zone
2. X‐Ray Diffraction Technique for the Investigation of Small Diffusion Zones
3. X-ray measurements of dislocation density in deformed Copper and Aluminum single crystals
4. A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder Photographs
5. A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction Lines
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1. X-ray diffraction study of concentration depth profiles of binary alloy coatings during thermal diffusion: application to brass coating;Journal of Applied Crystallography;1999-02-01
2. Analyse par diffraction des rayons X d'une couche de laiton obtenue par dépôt d'une couche de cuivre, d'une couche de zinc et diffusion;Le Journal de Physique IV;1998-10
3. X‐ray photoelectron forward scattering studies of surface segregation in epitaxial Ni–Cu–Ni(100) sandwich structures;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1989-05
4. X-Ray Diffraction Analysis of Diffusion in Thin Films;Treatise on Materials Science & Technology;1988
5. What Else Can We Learn from a Diffraction Experiment Besides the Average Structure?;Diffraction from Materials;1987
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