A simple technique to measure stress in ultrathin films during growth
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145316
Reference7 articles.
1. Mechanical stresses in (sub)monolayer epitaxial films
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4. UHV Cantilever Beam Technique for Quantitative Measurements of Magnetization, Magnetostriction, and Intrinsic Stress of Ultrathin Magnetic Films
5. The tension of metallic films deposited by electrolysis
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