Angle-resolved x-ray photoelectron spectroscopy comparison of copper/Teflon AF1600 and aluminum/Kapton metal diffusion
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.366706
Reference10 articles.
1. Advanced multilayer metallization schemes with copper as interconnection metal
2. The microstructure of metal–polyimide interfaces
3. Angle-resolved XPS and AES: Depth-resolution limits and a general comparison of properties of depth-profile reconstruction methods
4. Diffusion of Copper in Polymer During the Metallization of PET
5. Diffusion of metals deposited on a polyimide film (Kapton) under and out of irradiation
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