Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

Published:2016-05 Issue:5 Volume:87 Page:053703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Barrett N.¹,Gottlob D. M.¹,Mathieu C.¹,Lubin C.¹,Passicousset J.¹²^ORCID,Renault O.³,Martinez E.³

Affiliation:

1. SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France

2. IFP Energies nouvelles, Rond-point de l’échangeur de Solaize, BP 3, 69360 Solaize, France

3. University Grenoble-Alpes, 38000 Grenoble, France and CEA, LETI, MINATEC Campus, 38054 Grenoble, France

Funder

Agence Nationale de la Recherche (ANR)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4948597

Reference18 articles.

1. Determination of the electrostatic potential distribution in Pt/Fe:SrTiO3/Nb:SrTiO3 thin-film structures by electron holography

2. Band alignment issues related to HfO2∕SiO2∕p-Si gate stacks

3. X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface

4. Microscopic structure of theSiO2/Si interface

5. Surface photovoltage in semiconductors under pulsed optical excitation, and its relevance to synchrotron radiation spectroscopy

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time-resolved photoemission electron microscopy of semiconductor interfaces;Progress in Surface Science;2024-09

2. Operando investigation of nanocrystal-based device energy landscape: Seeing the current pathway;Nano Research;2024-05-18

3. Injection mechanisms in a III -nitride light-emitting diode as seen by self-emissive electron microscopy;Physical Review Applied;2023-12-26

4. Nondestructive imaging of breakdown process in ferroelectric capacitors using in situ laser-based photoemission electron microscopy;Applied Physics Letters;2023-10-23

5. Visualizing electroluminescence process in light-emitting electrochemical cells;Nature Communications;2023-03-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3