Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions-Reference-Cited by-同舟云学术

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Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctions

Published:2016-05 Issue:5 Volume:87 Page:053703
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Barrett N.¹,Gottlob D. M.¹,Mathieu C.¹,Lubin C.¹,Passicousset J.¹²^ORCID,Renault O.³,Martinez E.³

Affiliation:

1. SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette Cedex, France

2. IFP Energies nouvelles, Rond-point de l’échangeur de Solaize, BP 3, 69360 Solaize, France

3. University Grenoble-Alpes, 38000 Grenoble, France and CEA, LETI, MINATEC Campus, 38054 Grenoble, France

Funder

Agence Nationale de la Recherche (ANR)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4948597

Reference18 articles.

1. Determination of the electrostatic potential distribution in Pt/Fe:SrTiO3/Nb:SrTiO3 thin-film structures by electron holography

2. Band alignment issues related to HfO2∕SiO2∕p-Si gate stacks

3. X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy investigation of Al-related dipole at the HfO2/Si interface

4. Microscopic structure of theSiO2/Si interface

5. Surface photovoltage in semiconductors under pulsed optical excitation, and its relevance to synchrotron radiation spectroscopy

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3. Visualizing electroluminescence process in light-emitting electrochemical cells;Nature Communications;2023-03-01

4. Mapping the Energy Landscape from a Nanocrystal-Based Field Effect Transistor under Operation Using Nanobeam Photoemission Spectroscopy;Nano Letters;2023-01-24

5. Time-Resolved Operando Spectroscopy for Dye-Sensitized Solar Cells from Multiple Perspectives;The Journal of Physical Chemistry C;2022-04-26

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