X‐ray scattering studies of FeSi2films epitaxially grown on Si(111)
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.353431
Reference32 articles.
1. X‐ray total‐external‐reflection–Bragg diffraction: A structural study of the GaAs‐Al interface
2. Thin metallic silicide films epitaxially grown on Si(111) and their role in Si–metal–Si devices
3. Semiconducting silicide-silicon heterostructures: growth, properties and applications
4. Epitaxial silicides with the fluorite structure
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