Nanoscopic electric potential probing: Influence of probe–sample interface on spatial resolution
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1643534
Reference12 articles.
1. Nanopotentiometry: Local potential measurements in complementary metal–oxide–semiconductor transistors using atomic force microscopy
2. New aspects of nanopotentiometry for complementary metal–oxide–semiconductor transistors
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4. Two dimensional dopant and carrier profiles obtained by scanning capacitance microscopy on an actively biased cross-sectioned metal–oxide–semiconductor field-effect transistor
5. High resolution atomic force microscopy potentiometry
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