Z-contrast imaging of dislocation cores at the GaAs/Si interface
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1511808
Reference16 articles.
1. Gallium arsenide and other compound semiconductors on silicon
2. Defects in semiconductors and their effects on devices
3. Negative surface energy change associated with step formation caused by misfit dislocation nucleation in semiconductor heterostructures
4. Strain relief mechanisms and the nature of dislocations in GaAs/Si heterostructures
5. Mechanism of formation of 60° and 90° misfit dislocations in semiconductor heterostructures
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