Nonresonant detection of electric force gradients by dynamic force microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.112462
Reference16 articles.
1. Atomic Force Microscopy
2. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
3. Deposition and imaging of localized charge on insulator surfaces using a force microscope
4. Localized charge force microscopy
5. Localized charge force microscopy
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