Two-dimensional Fano lineshapes: Excited-state absorption contributions
Author:
Affiliation:
1. Division of Chemical Physics, Lund University, P.O. Box 124, 221 00 Lund, Sweden
2. Department of Chemistry, University of Copenhagen, DK 2100 Copenhagen, Denmark
Funder
Lundbeckfonden
Horizon 2020 Framework Programme
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5019376
Reference48 articles.
1. Effects of Configuration Interaction on Intensities and Phase Shifts
2. �ber Absorptionsserien von Argon, Krypton und Xenon zu Termen zwischen den beiden Ionisierungsgrenzen2 P 3 2/0 und2 P 1 2/0
3. Perspectives on the Fano Resonance Formula
4. Intrinsic Fano Interference of Localized Plasmons in Pd Nanoparticles
5. Fano resonances in nanoscale structures
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Exciton–photocarrier interference in mixed lead-halide-perovskite nanocrystals;The Journal of Chemical Physics;2024-06-10
2. Exciton-carrier coupling in a metal halide perovskite nanocrystal assembly probed by two-dimensional coherent spectroscopy;Journal of Physics: Materials;2024-02-09
3. Controlling laser-dressed resonance line shape using attosecond extreme-ultraviolet pulse with a spectral minimum;Proceedings of the National Academy of Sciences;2024-01-03
4. Surface-enhanced ultrafast two-dimensional vibrational spectroscopy with engineered plasmonic nano-antennas;The Journal of Chemical Physics;2020-08-07
5. A Correction Scheme for Fano Line Shapes in Two-Dimensional Infrared Spectroscopy;The Journal of Physical Chemistry Letters;2020-07-13
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3