Analysis of electron beam induced deposition (EBID) of residual hydrocarbons in electron microscopy
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2437065
Reference18 articles.
1. Dynamic profile calculation of deposition resolution by high-energy electrons in electron-beam-induced deposition
2. N. Silvis-Cividjian, Ph.D. thesis, University of Delft, 2002.
3. Fabrication of nanofigures by focused electron beam-induced deposition
4. Spatial resolution limits in electron-beam-induced deposition
5. Growth and simulation of high-aspect ratio nanopillars by primary and secondary electron-induced deposition
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