High-frequency noise characterization of graphene field effect transistors on SiC substrates
Author:
Affiliation:
1. National Key Laboratory of ASIC, Hebei Semiconductor Research Institute, Shijiazhuang 050051, China
Funder
National Natural Science Foundation of China (NSFC)
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4994324
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1. Giant Intrinsic Carrier Mobilities in Graphene and Its Bilayer
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