Spectroscopic ellipsometry study of thin NiO films grown on Si (100) by atomic layer deposition
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2938697
Reference17 articles.
1. Optical Properties of NiO and CoO
2. Finite Size Effects in Antiferromagnetic NiO Nanoparticles
3. Chromogenic smart materials
4. Reproducible resistance switching in polycrystalline NiO films
5. Impedance spectroscopy characterization of resistance switching NiO thin films prepared through atomic layer deposition
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