Use of Optical Density Measurements of Thin Films to Determine Vapor Distributions-Reference-Cited by-同舟云学术

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Use of Optical Density Measurements of Thin Films to Determine Vapor Distributions

Published:1963-07 Issue:7 Volume:34 Page:740-741
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Anastasio Thomas A.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1718561

Reference3 articles.

1. The distribution of thin films condensed on surfaces by the vacuum evaporation method

2. A Tracer Method for the Thickness Measurement of Thin Bi Films

3. Vapor Pressure of Plastic Materials

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurements of angular evaporation characteristics of sources;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1983-07

2. Use of the Quartz-Crystal Rate Monitor to Determine Vapor Distributions;Journal of Vacuum Science and Technology;1967-07

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