Si nanowire growth with ultrahigh vacuum scanning tunneling microscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.118711
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1. Characterization and Application of Materials Grown by Electron-Beam-Induced Deposition
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4. Deposition and subsequent removal of single Si atoms on the Si(111)-7×7 surface by a scanning tunneling microscope
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