Gigahertz scanning acoustic microscopy analysis of voids in Cu-Sn micro-connects
Author:
Affiliation:
1. Department of Electrical Engineering and Automation, Aalto University, P.O. Box 13500, FIN-00076 Aalto, Finland
2. Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Halle (Saale), Germany
Funder
Lab4MEMS II
Metro43D
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Reference17 articles.
1. Transition from flip chip solder joint to 3D IC microbump: Its effect on microstructure anisotropy
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5. Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability
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