Compact variable-temperature scanning force microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2735568
Reference29 articles.
1. Atomic Force Microscope
2. True Atomic Resolution by Atomic Force Microscopy Through Repulsive and Attractive Forces
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5. High resolution atomic force microscopy potentiometry
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